Nov. 15, 2021
【Updated】Analytical Technology Information Site for the Semiconductor Field
Toray Research Center, Inc. (TRC) is pleased to offer a website that collects technical documents and presentation movie that introduce the latest analysis technologies and case studies, as well as academic papers that have been presented at various conferences, in the semiconductor field.
Information is updated every month and this month's topic is as follows.
＊Topic in November＊
Movie：
・High Precision Film Quality Analysis of SiN Films by Mercury Probe and XPS
・Impurity analysis of small area using NanoSIMS 50L
・Evaluation of semiconductor materials by FT-IR
Technical Documents ：
・The latest analytical technologies and six case studies using each technologies that we introduced at ECSCRM in France.
(Analytical technologies : TEM, Nano-SIMS, AFM-Raman, STEM-CL, ASTAR, micro-RBS)
You can see the contents including the past publications for free.
Please visit the following URL!
URL：
https://www3.toray-research.co.jp/special_contents/semiconductor/semiconductor_index.html