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Aug. 29, 2019
Toray Research Center, Inc.
International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)
 

 

Sun. Sep 29 - Fri. Oct 4, 2019
1 Oral Presentation , 3 Poster Presentations and Exhibition: Sun. Sep 29 - Fri. Oct 4, 2019
Kyoto International Conference Center, Kyoto, Japan
Booth No. A1

 

◆Oral Presentation :
Tue. Oct 1, 2019 3:15 PM - 3:30 PM Room A
J. Sameshima et al.
Profiling with Depth Resolution of Sub-nm for SiO2/SiC Interface by Dualbeam TOF-SIMS Combined with Simulation
 

◆Poster Presentation :
1.Tue. Oct 1, 2019 4:15 PM - 6:15 PM Annex Hall 1
S. Hayashi et al.
Influence of basal-plane dislocation depth and core-structure on stacking fault expansion in forward-current degradation of 4H-SiC p-i-n diodes
2.Tue. Oct 1, 2019 4:15 PM - 6:15 PM Annex Hall 1
A. Hashimoto et al.
Structural Characterization of a Ga2O3 Epitaxial Layer Grown on a Sapphire Substrate using Cross-sectional and Plan-view TEM/STEM analysis
3.Thu. Oct 3, 2019 1:45 PM - 3:45 PM Annex Hall 1
H. Sako et al.
Characterization of Prismatic Stacking Faults of Carrot Defects in 4H-SiC Epi Wafer
 
 
 
★Lab tour at Toray Research Center, Inc. :
We will be holding Lab Tour of Toray Research Center, Inc. during the conference.
 

・VenueToray Research Center, Inc.
3-3-7, Sonoyama, Otsu, Shiga, 520-8558 Japan
It is just 15 minutes by train from JR Kyoto station, and about 5 minutes by taxi.
・DurationMon. Sep 30 - Fri. Oct 4, 2019
 
※If you are interested in the tour, please contact our marketers below and tell us your preferred time slot and interested analytical techniques.
Yoshiki Nishiwaki, Marketer, Kansai Sales Office
email: Yoshiki_Nishiwaki@trc.toray.co.jp
Haruka Hidaka, Marketer, Tokyo Sales Office 
email: Haruka_Hidaka@trc.toray.co.jp


ICSCRM2019 Website