The article of “An effect of residual gas component on detected secondary ions during TOF-SIMS depth profiling and a method to estimate contained component” written by Junichiro Sameshima, Toray Research Center has chosen as the front cover image of the Surface and Interface Analysis, Volume 50, Issue 8, indicated in Fig. 1.

　
　

　
　
https://onlinelibrary.wiley.com/toc/10969918/2018/50/8